Basic of signal integrity - Eye diagram and Jitter measurement with high bandwidth, real time, hw accelerated oscilloscopes
LECTURER
Dario Scarano
Rohde&Schwarz, Senior Sales Engineer
Tommaso Tessitore
Rohde&Schwarz, Senior Application Engineer
ABSTRACT
The use of serial data is increasingly widespread in all electronic applications and the demand for ever greater performance has increased its speed exponentially (from hundreds of Mbit/s to tens of Gbit/s). Applications that have already made extensive use of it for some time, such as Telecom and Datacom, are now joined by others, such as those of Aerospace and Defense and especially those of the Automotive world.
This presentation is aimed at all those who are approaching the analysis of fast serial data for the first time.
It provides an idea of what are the problems of signal integrity and indicates the basic measures, such as the eye diagram and the jitter measurements, necessary to ensure reliable projects with reduced development times.
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